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Shear-Force Ultrasonic Near-Field Microscope

The Shear-Force Ultrasonic Near-Field Microscope (SUNM) is a nanometrology tool for surface and subsurface materials characterization, including the dynamic behavior of fluid-like mesoscopic films confined between two sliding solid boundaries. By mechanically exciting the film and detecting the resulting sound emitted, the elastic properties of the...

Published: 7/30/2009 | Updated: 6/3/2009 | Inventor(s): Andres Larosa, Richard Nordstrom

Keywords(s): Mechanical & Materials Engineering, Microscopy, Nanotechnology, Physics

Category(s): Physical Science